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Wafer Dicing Dataset

The dataset used in this paper for visual attention and deep learning for wafer dicing and defect detection.

Data and Resources

Cite this as

Frederik Beuth, Tobias Schlosser, Michael Friedrich, Danny Kowerko (2024). Dataset: Wafer Dicing Dataset. https://doi.org/10.57702/6aiwzfdn

DOI retrieved: December 3, 2024

Additional Info

Field Value
Created December 3, 2024
Last update December 3, 2024
Defined In https://doi.org/10.48550/arXiv.2102.06955
Author Frederik Beuth
More Authors
Tobias Schlosser
Michael Friedrich
Danny Kowerko