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Wafer Dicing Dataset

The dataset used in this paper for visual attention and deep learning for wafer dicing and defect detection.

Data and Resources

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Cite this as

Frederik Beuth, Tobias Schlosser, Michael Friedrich, Danny Kowerko (2024). Dataset: Wafer Dicing Dataset. https://doi.org/10.57702/6aiwzfdn

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Additional Info

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Created December 3, 2024
Last update December 3, 2024
Defined In https://doi.org/10.48550/arXiv.2102.06955
Author Frederik Beuth
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Tobias Schlosser
Michael Friedrich
Danny Kowerko