EPMA data from tephra layer in IODP 374 Expedition Site U1524

Major-element data of single glass shards (raw data, normalized, and from U1524 tephra found in the U1524 from IODP Expedition 374 sites. Analyses were carried out with a JEOL JXA 8230 electron probe microanalyzer (EPMA) at Victoria University of Wellington using wavelength dispersive spectrometry techniques. Data includes calibrated international standards including ATHO-G, T1-G (Jochum et al., 2006), and VG-568 (USNM 72854) analyzed to monitor instrumental drift as well as the precision and accuracy of the analyses.

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