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Deep Learning in Optical Metrology
Data and Resources
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Cite this as
Chao Zuo, Jiaming Qian, Shijie Feng, Wei Yin, Yixuan Li, Pengfei Fan, Jing Han, Kemao Qian, Qian Chen (2024). Dataset: Deep Learning in Optical Metrology. https://doi.org/10.57702/y7bp1bgt
Private DOI This DOI is not yet resolvable.It is available for use in manuscripts, and will be published when the Dataset is made public.
Additional Info
Field | Value |
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Created | December 3, 2024 |
Last update | December 3, 2024 |
Defined In | https://doi.org/10.48550/arXiv.2406.12904 |
Author | Chao Zuo |
More Authors |
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Homepage | https://github.com/kc-ml2/meent |