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ST dataset

The ST dataset contains 31,893 Wafer Defect Maps acquired at the STMicroelectronics plant in Agrate Brianza, Italy.

Data and Resources

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Cite this as

Luca Frittoli, Diego Carrera, Beatrice Rossi, Pasqualina Fragneto, Giacomo Boracchi (2024). Dataset: ST dataset. https://doi.org/10.57702/95gc6k71

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It is available for use in manuscripts, and will be published when the Dataset is made public.

Additional Info

Field Value
Created December 3, 2024
Last update December 3, 2024
Defined In https://doi.org/10.1016/j.patcog.2021.108488
Author Luca Frittoli
More Authors
Diego Carrera
Beatrice Rossi
Pasqualina Fragneto
Giacomo Boracchi
Homepage https://doi.org/10.1016/j.patcog.2021.108488