Dataset Groups Activity Stream ST dataset The ST dataset contains 31,893 Wafer Defect Maps acquired at the STMicroelectronics plant in Agrate Brianza, Italy. BibTex: @dataset{Luca_Frittoli_and_Diego_Carrera_and_Beatrice_Rossi_and_Pasqualina_Fragneto_and_Giacomo_Boracchi_2024, abstract = {The ST dataset contains 31,893 Wafer Defect Maps acquired at the STMicroelectronics plant in Agrate Brianza, Italy.}, author = {Luca Frittoli and Diego Carrera and Beatrice Rossi and Pasqualina Fragneto and Giacomo Boracchi}, doi = {10.57702/95gc6k71}, institution = {No Organization}, keyword = {'Image Classification', 'Quality Inspection', 'Wafer Defect Maps'}, month = {dec}, publisher = {TIB}, title = {ST dataset}, url = {https://service.tib.eu/ldmservice/dataset/st-dataset}, year = {2024} }
