ST dataset

The ST dataset contains 31,893 Wafer Defect Maps acquired at the STMicroelectronics plant in Agrate Brianza, Italy.

Data and Resources

Original MetadataJSON
The json representation of the dataset with its distributions based on DCAT.
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Luca Frittoli, Diego Carrera, Beatrice Rossi, Pasqualina Fragneto, Giacomo Boracchi (2024). Dataset: ST dataset. https://doi.org/10.57702/95gc6k71

DOI retrieved: December 3, 2024

Field	Value
Created	December 3, 2024
Last update	December 3, 2024
Defined In	https://doi.org/10.1016/j.patcog.2021.108488
Author	Luca Frittoli
More Authors	Diego Carrera Beatrice Rossi Pasqualina Fragneto Giacomo Boracchi
Homepage	https://doi.org/10.1016/j.patcog.2021.108488