Cite this as

Alexander E. Siemenn, Eunice Aissi, Fang Sheng, Armi Tiihonen, Hamide Kavak, Basita Das, Tonio Buonassisi (2024). Dataset: Using Scalable Computer Vision to Automate High-throughput Semiconductor Characterization. Resource: Original Metadata. https://doi.org/10.57702/mma2o4zp

DOI retrieved: December 16, 2024