Using Scalable Computer Vision to Automate High-throughput Semiconductor Characterization
Data and Resources
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Original MetadataJSON
The json representation of the dataset with its distributions based on DCAT.
Cite this as
Alexander E. Siemenn, Eunice Aissi, Fang Sheng, Armi Tiihonen, Hamide Kavak, Basita Das, Tonio Buonassisi (2024). Dataset: Using Scalable Computer Vision to Automate High-throughput Semiconductor Characterization. https://doi.org/10.57702/mma2o4zp
DOI retrieved: December 16, 2024
Additional Info
Field | Value |
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Created | December 16, 2024 |
Last update | December 16, 2024 |
Defined In | https://doi.org/10.1038/s41467-024-48768-2 |
Author | Alexander E. Siemenn |
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