3D X-ray Microscopy for 3D Object Detection, Segmentation, and Metrology

3D X-ray microscope data for 3D object detection, segmentation, and metrology for buried structures in advanced IC packages

Data and Resources

Cite this as

Ramanpreet S Pahwa, Soon Wee Ho, Ren Qin, Richard Chang, Oo Zaw Min, Wang Jie, Vempati Srinivasa Rao, Tin Lay Nwe (2024). Dataset: 3D X-ray Microscopy for 3D Object Detection, Segmentation, and Metrology. https://doi.org/10.57702/dhnpgnkd

DOI retrieved: December 16, 2024

Additional Info

Field Value
Created December 16, 2024
Last update December 16, 2024
Defined In https://doi.org/10.23919/IWLPC52010.2020.9375903
Author Ramanpreet S Pahwa
More Authors
Soon Wee Ho
Ren Qin
Richard Chang
Oo Zaw Min
Wang Jie
Vempati Srinivasa Rao
Tin Lay Nwe
Homepage https://arxiv.org/abs/2009.11115